SirenOpt uses cold atmospheric plasma and AI to provide real-time, non-destructive material characterization across semiconductor, battery, and aerospace manufacturing. Their PlasmaSens platform measures multiple material properties simultaneously without sample destruction or preparation. The technology enables inline quality control and process optimization in high-throughput production environments.
Measure silicon wafer thickness and chemical composition in real-time; Detect defects in battery electrode coatings; Monitor thermal barrier coating microstructure on jet turbine blades; Classify polymer film contaminants in medical devices; Verify SiO2 TeOS layer uniformity in semiconductor fabrication
Awarded $2.4M in BRIDGE funding by California Energy Commission; Developed from UC Berkeley Chemical Engineering Department; Supported by UC Berkeley Skydeck and Lawrence Berkeley National Laboratory; Validated in battery, semiconductor, and aerospace production environments