Attolight Analysis: $4M Raised
What is Attolight?
Nanometer-resolution CL with pico-second timing for semiconductor defect inspection
Location
Lausanne, Switzerland
Employees
11-50
Founded
2008
Product Features & Capabilities
- Allalin multi-spectroscopic CL SEM platform
- Mönch CL add-on for STEM
- Säntis 300 full wafer CL SEM
- Spectrally-resolved quantitative CL analysis
- Time-resolved cathodoluminescence (TRCL) capabilities
Use Cases
Classify defects in SiC wafers using spectrally-resolved CL; Monitor epitaxial layer uniformity in GaN power devices; Analyze lead halide perovskite optical properties with CL-STEM; Perform non-destructive quality control in semiconductor manufacturing; Characterize crystallographic defects in glass and ceramics
Other Considerations
30+ systems installed globally; Partnerships with Korea ITS and Loughborough University; Trusted by top semiconductor companies and research institutes including CEA-LETI, Lawrence Berkeley National Lab, and Yale University
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